MBE Technological Laboratory with quality control of manufactured SIMS structures
MBE Technological Laboratory and nanostructure quality control
Professor Dr hab. Eugeniusz Szeregij - prof. Director, Laboratory Manager
prof. Dr hab. Mikołaj Berchenko - prof. zw.
Dr. Charles Becker - prof. visiting
Dr Ireneusz Stefaniuk - st. Director of teaching ..
Mgr Małgorzata Trzyna - assistant
Mgr Mariusz Woźny - assistant
Mgr Jakub Grendysa - scientific and technical worker
Mgr Marek Witalec - engineer and administration
Double RIBER COMPACT 21 Double Mass Spectrometer TOF-SIMS
The laboratory incorporates the Double RIBER COMPACT 21 installation with quality control of the structures obtained: Secondary Mass Spectrometry - TOF-SIMS, which allows for composition control to an accuracy of 1018 cm-3.
The Laboratory has been able to master the technology of MCT layers containing Dirak, including nanostructures based on them. This is one of the hottest problems in modern semiconductor physics - topological insulators - new quantum state of substances.
PRODUCING OF STRONG TOPOLOGICAL INSULATORS BASED ON SEMIMETALIC HgCdTe
The HGCdTe manostructure technology has also been mastered in the Laboratory
Deep profile of grown nanostructure: the QW from HgCdTe is seen at 120 nm.
This technology will be implemented in the industry to produce high-sensitivity and high-speed thermal imaging cameras - Patent No. P.403346.
Effect of Dirac point on electrons and phonics in nanostructures based on semiconductor compounds HgCdTe, HgZnTe, WND-RPPK.01.03.00-18-053 / 12. Funding Source: Podkarpackie Regional Operational Program for the years 2007 - 2013, PLN 2 971 206.
G. Tomak, J. Grendys, P. Slij, CR Becker, J. Polit, R. Wojnarowska, A. Stadler, and EM Sheregii, High-temperature stability of electron transport in semiconductors with strong spin-orbital interaction, PHYSICAL REVIEW B 93, 205419 (2016).